High Quality c Axis Oriented Non Vacuum Er Doped ZnO Thin Films

AŞIKUZUN TOKEŞER, Elif; ÖZTÜRK, Özgür; Arda, L.; TAŞÇI, Ahmet Tolga; KARTAL, Fuat; Terzioglu, C.

doi:10.1016/j.ceramint.2016.02.008

High Quality c Axis Oriented Non Vacuum Er Doped ZnO Thin Films

Yazarlar (6)

Doç. Dr. Elif AŞIKUZUN TOKEŞER Kastamonu Üniversitesi, Türkiye

Prof. Dr. Özgür ÖZTÜRK Kastamonu Üniversitesi, Türkiye

L. Arda
Bahçeşehir Üniversitesi, Türkiye

Prof. Dr. Ahmet Tolga TAŞÇI Kastamonu Üniversitesi, Türkiye

Prof. Dr. Fuat KARTAL Kastamonu Üniversitesi, Türkiye

C. Terzioglu
Bolu Abant İzzet Baysal Üniversitesi, Türkiye

Makale Türü	Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale)
Dergi Adı	Ceramics International
Dergi ISSN	0272-8842 Wos Dergi Scopus Dergi
Dergi Tarandığı Indeksler	SCI-Expanded
Makale Dili	İngilizce	Basım Tarihi	05-2016
Cilt / Sayı / Sayfa	42 / 7 / 8085–8091	DOI	10.1016/j.ceramint.2016.02.008
UAK Araştırma Alanları	Yarı İletkenler

Özet

Preparation, growth, structure and optical properties of high-quality c-axis oriented non-vacuum Er doped ZnO thin films were studied. Zn1-xErxO (x=0.0, 0.01, 0.02, 0.04, and 0.05) precursor solutions were prepared by sol-gel synthesis using Zn, and Er based alkoxide which were dissolved into solvent and chelating agent. Zn1-xErxO thin films with different Er doping concentration were grown on glass substrate using sol-gel dip coating. Thin films were annealed at 600 °C for 30 min, and tried to observe the effect of doping ratio on structural and optical properties. The particle size, crystal structure, surface morphologies and microstructure of all samples were characterized by X-Ray diffraction (XRD) and Scanning Electron Microscope (SEM). The UV-vis spectrometer measurements were carried out for the optical characterizations. The surface morphology of the Zn1-xErxO films depend on substrate nature and sol-gel parameters such as withdrawal speed, drying, heat treatment, deep number (film thickness) and annealing condition. Surface morphologies of Er doped ZnO thin films were dense, without porosity, uniform, crack and pinhole free. XRD results showed that, all Er doped ZnO thin films have a hexagonal structure and (002) orientation. The optical transmittance of rare earth element (Er) doped ZnO thin films were increased. The Er doped ZnO thin films showed high transparency (>85) in the visible region (400-700 nm).

Anahtar Kelimeler

Bandgap Energy | Er-doping | Orientation | Thin Film | ZnO

Science Direct

BM Sürdürülebilir Kalkınma Amaçları

Atıf Sayıları
Scopus	38

High Quality c Axis Oriented Non Vacuum Er Doped ZnO Thin Films

Dergi Adı	Ceramics International
Yayıncı	Elsevier Ltd
Açık Erişim	Hayır
ISSN	0272-8842
E-ISSN	1873-3956
CiteScore	9,1
SJR	1,034
SNIP	1,257

High Quality c Axis Oriented Non Vacuum Er Doped ZnO Thin Films

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