Comparative investigation on electronic properties of metal-semiconductor structures with variable ZnO thin film thickness for sensor applications
Yazarlar (4)
Doç. Dr. Osman ÇİÇEK Kastamonu Üniversitesi, Türkiye
Öğr. Gör. Dr. Sedat KURNAZ Kastamonu Üniversitesi, Türkiye
Atakan Bekar Sinop Üniversitesi, Türkiye
Prof. Dr. Özgür ÖZTÜRK Kastamonu Üniversitesi, Türkiye
| Makale Türü | Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale) | ||
| Dergi Adı | Composites Part B Engineering (Q1) | ||
| Dergi ISSN | 1359-8368 Wos Dergi Scopus Dergi | ||
| Dergi Tarandığı Indeksler | SCI-Expanded | ||
| Makale Dili | İngilizce | Basım Tarihi | 05-2019 |
| Cilt / Sayı / Sayfa | 174 / 1 / – | DOI | 10.1016/j.compositesb.2019.106987 |
| Makale Linki | https://linkinghub.elsevier.com/retrieve/pii/S135983681930890X | ||
| Özet |
| In this work, AuPd/n-GaAs and Ag/n-GaAs metal–semiconductor structures, which is known as Schottky Junction Structures (SJSs), with various ZnO thin film thickness (25–250 nm) classified as Group AuPd and Group Ag were produced to investigate electronic properties on SJSs. The current-voltage (I–V) characteristics of SJSs operating in their forward... |
| Anahtar Kelimeler |
| A nano-structures | A. Layered structures | A. Thin films | B. Electrical properties |
Science Direct
Comparative investigation on electronic properties of metal-semiconductor structures with variable ZnO thin film thickness for sensor applications
BM Sürdürülebilir Kalkınma Amaçları
| Atıf Sayıları | |
| Scopus | 14 |