| Yazarlar |
Osman Cicek
Kastamonu University, Turkey |
|
Yosef Badali
Istanbul Ticaret Üniversitesi, Turkey |
| Özet |
| Gallium Nitride (GaN) based High Electron Mobility Transistors (HEMTs) are regarded as fundamental semiconductor devices for future power electronic applications. Consequently, researchers have directed their efforts toward enhancing critical parameters such as the breakdown voltage (Vbr), cut-off frequency, and operating temperature. Therefore, this review article explores research endeavors concerning the enhancement of Vbr in GaN-based HEMTs. The objective is to gain insights into the key factors influencing Vbr values and to identify the constraints that govern the optimal performance of HEMTs in power devices. Additionally, this review provides an in-depth examination of select studies that introduce novel techniques for improving Vbr values. |
| Anahtar Kelimeler |
| Breakdown Voltage Enhancement | Electric breakdown | Electric fields | Field-Plated Structure | GaN | HEMTs | HEMTs | III-V semiconductor materials | Logic gates | Negative-Bias Temperature Instability | Passivation | Passivation Layer | Transistors | Wide-bandgap |
| Makale Türü | Özgün Makale |
| Makale Alt Türü | SCOPUS dergilerinde yayımlanan tam makale |
| Dergi Adı | IEEE Transactions on Device and Materials Reliability |
| Dergi ISSN | 1530-4388 |
| Makale Dili | İngilizce |
| Basım Tarihi | 01-2024 |
| Sayı | 1 |
| Doi Numarası | 10.1109/TDMR.2024.3379745 |
| Atıf Sayıları |
