Photodiode and photodetector characteristics of Ag/MnPc/Si/Ag and Ag/MnPc/SiO2/Ag heterojunctions
Yazarlar (7)
Doç. Dr. Fatih Ünal Giresun Üniversitesi, Türkiye
Doç. Dr. Mümin Mehmet Koç Kırklareli Üniversitesi, Türkiye
Doç. Dr. Sıtkı Aktaş Giresun Üniversitesi, Türkiye
Prof. Dr. Burhan Coşkun Kırklareli Üniversitesi, Türkiye
Doç. Dr. Mustafa Şükrü Kurt Bursa Teknik Üniversitesi, Türkiye
Prof. Dr. Mahmut GÜR Kastamonu Üniversitesi, Türkiye
Prof. Dr. Tayfun Arslan Giresun Üniversitesi, Türkiye
| Makale Türü | Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale) | ||
| Dergi Adı | Journal of Materials Science Materials in Electronics (Q2) | ||
| Dergi ISSN | 0957-4522 Dergi Bilgileri (2025) | ||
| Dergi Tarandığı Indeksler | SCI-Expanded | ||
| Makale Dili | Türkçe | Basım Tarihi | 08-2025 |
| Cilt / Sayı / Sayfa | 36 / 23 / 1–12 | DOI | 10.1007/s10854-025-15575-4 |
| Makale Linki | https://doi.org/10.1007/s10854-025-15575-4 | ||
| UAK Araştırma Alanları |
Organik Kimya
Spektroskopi
|
||
| Özet |
| Manganese (III) phthalocyanine (4) (modified MnPc) was synthesized by tetramerization of the relevant phthalonitrile under appropriate conditions and thermally coated on Si and SiO2 coated surfaces for the preparation of Ag/MnPc/Si/Ag and Ag/MnPc/SiO2/Ag heterojunctions. Series of investigation methods were applied to assess structural, optical and optoelectronic properties. For the assessment of surface morphology and structure, scanning electron microscopy (SEM) and X-ray diffractometry (XRD) techniques were applied, respectively. Optical properties were evaluated using UV–vis spectrophotometry where energy band gap of the MnPc, Si and SiO2 thin films were derived as 2.46 eV, 2.79 eV and 2.6 eV, respectively. I-V investigation was employed in dark and under various illumination intensities in 20 mW.cm−2, 40 mW.cm−2, 60 mW.cm−2, 80 mW.cm−2 and 100 mW.cm−2. Using I-V data different device … |
| Anahtar Kelimeler |
BM Sürdürülebilir Kalkınma Amaçları
| Atıf Sayıları | |
| Google Scholar | 2 |