Yazarlar (6) |
![]() Kastamonu Üniversitesi, Türkiye |
![]() Kastamonu Üniversitesi, Türkiye |
![]() Kastamonu Üniversitesi, Türkiye |
![]() Bahçeşehir Üniversitesi, Türkiye |
![]() Sinop Üniversitesi, Türkiye |
![]() Abant İzzet Baysal Üniversitesi, Türkiye |
Özet |
Undoped and Er doped ZnO (Zn1-x Er x O) transparent semiconductor thin films were coated using sol-gel method on non-alkali glass. Erbium was doped 1%, 2%, 3%, 4% and 5% ratio. Methanol and monoethanolamine were used as solvent and stabilizer. In this study, the effect of Er doping was examined on the structural and optical properties of ZnO DMS thin films. XRD, SEM and UV-VIS-NIR spectrometer measurements were performed for the structural and optical characterization. XRD results showed that, all of Er doped ZnO thin films have a hexagonal structure. The optical transmittance of rare earth element (Er) doped ZnO thin films were increased. The Er doped ZnO thin films showed high transparency (> 84) in the visible region (400-700 nm). |
Anahtar Kelimeler |
Bildiri Türü | Tebliğ/Bildiri |
Bildiri Alt Türü | Özet Metin Olarak Yayınlanan Tebliğ (Uluslararası Kongre/Sempozyum) |
Bildiri Niteliği | Alanında Hakemli Uluslararası Kongre/Sempozyum |
Bildiri Dili | İngilizce |
Kongre Adı | American Physical Society March Meeting 2016 |
Kongre Tarihi | 14-03-2016 / 18-03-2016 |
Basıldığı Ülke | |
Basıldığı Şehir |